Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. - Contributions from leading authorities
- Informs and updates on all the latest developments in the field

- Precession Electron DiffractionA. S. Eggeman and P. A. Midgley
- Scanning Helium Ion MicroscopyR. Hill, J. A. Notte, and L. Scipioni
- Signal reconstruction algorithm based on a single intensity in the Fresnel domainHone-Ene Hwang, Pin Han
- Electron Microscopy Studies on Magnetic L10 FePd NanoparticlesKazuhisa Sato, Toyohiko J. Konno, Yoshihiko Hirotsu
- Fundamental aspects of Near Field Emission Scanning Electron MicroscopyD. A. Zanin, H. Cabrera, L. De Pietro, M. Pikulski, M. Goldmann, U. Ramsperger, D. Pescia, J. P. Xanthakis