Advances in Imaging and Electron Physics

Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

J. P. Bird, R. Akis, D. Ferry, and M. Stopa, Magneto-Transport as a Probe of Electron Dynamics in Open Quantum Dots. Mohammad F. Alam and Mohammad A. Karim, External Optical Feedback Effects in DFB Semiconductor Lasers. A. Rosenauer and B. Gerthsen, Atomic Scale Strain and Composition Evaluation from High-Resolution Transmission Electron Microscopy Images. R. C. Staunton, Hexagonal Sampling in Imaging Processing. Jeffrey Wood, The Group Representation Network: A General Approach to Invariant Pattern Classification.