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Francis M. Mirabella

Internal Reflection Spectroscopy

Theory and Applications. Sprachen: Englisch. 24,0 cm / 16,1 cm / 2,5 cm ( B/H/T )
Buch (Hardcover), 388 Seiten
EAN 9780824787301
Veröffentlicht Oktober 1992
Verlag/Hersteller CRC Press

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Beschreibung

Presents coverage of internal reflection spectroscopy (IRS) and its applications to polymer, semiconductor, biological, electrochemical and membrane research. It describes the theory and procedures and identifies the spectral regions, from materials characterization to process monitoring.

Portrait

Francis M. Mirabella, Jr. is Associate Scientist of Polymer Physics at Quantum Chemical Corporation, Morris, Illinois. The author or coauthor of over 55 journal articles and book chapters and author of one book, he is a member of the American Chemical Society, the Society for Applied Spectroscopy, and the Coblentz Society. Dr. Mirabella has been active in the development of internal reflection spectroscopy and has organized a series of symposia through the Federation of Analytical Chemistry and Spectroscopy Societies' national meetings. He received the M.S. degree (1974) in organic chemistry and the Ph.D. degree (1975) in polymer science from the University of Connecticut, Storrs.

Inhaltsverzeichnis

Preface, Contributors, 1. History of Internal Reflection Spectroscopy, 2. Principles, Theory, and Practice of Internal Reflection Spectroscopy, 3. The Industrial Applications of Infrared Internal Reflection Spectroscopy, 4. Process Monitoring Applications of Multiple Internal Reflection Spectroscopy, 5. Biological Applications of Attenuated Total Reflection (ATR) Spectroscopy, 6. The Determination of Molecular Spatial Orientation, 7. Spectral Regions and Special Applications of Internal Reflection Spectroscopy, 8. Studies of Semiconductor Surfaces: Vibrational Spectroscopy of Adsorbates, 9. Electrochemical Applications of Internal Reflection Spectroscopy, 10. In Situ Infrared Attenuated Total Reflection Membrane Spectroscopy, 11. Determination of Optical Constants, 12. Matrix Dependence in Single and Multilayer IRS Spectra, Index

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