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Fiber Optic Measurement Techniques is an indispensable collection of key optical measurement techniques essential for developing and characterizing today's photonic devices and fiber optic systems. The book gives comprehensive and systematic descriptions of various fiber optic measurement methods with the emphasis on the understanding of optoelectronic signal processing methodologies, helping the reader to weigh up the pros and cons of each technique and establish their suitability for the task at hand. Carefully balancing descriptions of principle, operations and optoelectronic circuit implementation, this indispensable resource will enable the engineer to: - Understand the implications of various measurement results and system performance qualifications - Characterize modern optical systems and devices - Select optical devices and subsystems in optical network design and implementation - Design innovative instrumentations for fiber optic systems The 2nd edition of this successful reference has been extensively updated (with 150 new pages) to reflect the advances in the field since publication in 2008 and includes: - A new chapter on fiber-based optical sensors and spectroscopy techniques - A new chapter on measurement uncertainty and error analysis Fiber Optic Measurement Techniques brings together in one volume the fundamental principles with the latest techniques, making it a complete resource for the optical and communications engineer developing future optical devices and fiber optic systems.
Rongqing Hui is a professor of Electrical Engineering and Computer Science at the University of Kansas, Lawrence, United States. His research interests are in lightwave communication systems and subsystems, photonic devices, optical instrumentation, and photonic sensors.
1. Fundamentals of optical devices 2. Basic Instrumentation for Optical Measurement 3. Characterization of optical devices 4. Optical fiber measurement 5. Fiber-based optical sensors and spectroscopy techniques 6. Optical system performance measurements 7. Measurement uncertainty and error analysis
